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JEOL 2100F FEG TEM

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设备编号:2100F

设备型号:JEOL 2100F

放置地点:MSE

设备类别:结构表征

管理员:秦元斌

管理员电话:028-82664906

管理员邮箱:qinobin@gmail.com

院内价格:0

校内价格:0

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主要功能:

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries. The JEM-2100F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100F have been equipped with STEM, EDS, EELS, and CCD-cameras.